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Joint Test Action Group
Results: 911

#	Item
291	Curtiss–Wright www.xjtag.com Curtiss-Wright selects XJTAG to debug and test complex PCBs Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2008-07-04 06:34:39 Electronics Boundary scan Joint Test Action Group Curtiss-Wright Embedded system Radar Technology Electronics manufacturing Manufacturing
292	Intrinsic Quality www.xjtag.com XJTAG Technology Partner Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-10-14 06:08:41 Cross-platform software Numerical software Electronics LabWindows/CVI LabVIEW Joint Test Action Group In-circuit test National Instruments Boundary scan Electronics manufacturing Software Manufacturing
293	www.xjtag.com Imagination Technologies Mark Dunn, VP Engineering with Simon Payne, CEO XJTAG Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-09-07 08:16:06 Technology Joint Test Action Group Boundary scan System on a chip Scan chain Design for testing Electronics manufacturing Electronic engineering Electronics
294	Danville Signal Processing, Inc. dspblok™ 21469+USB FLASH CORE PS EEPROM Add to Reading List Source URL: www.danvillesignal.com Language: English - Date: 2012-12-19 11:25:02 Microcontrollers Digital signal processors Instruction set architectures Integrated circuits Embedded systems Joint Test Action Group Blackfin Analog Devices Universal Serial Bus Electronic engineering Electronics Computer hardware
295	Parallella-1.x Reference Manual REV Add to Reading List Source URL: www.parallella.org Language: English - Date: 2014-09-09 12:30:46 Embedded systems Reconfigurable computing Universal Serial Bus Field-programmable gate array Joint Test Action Group HDMI Pinout Serial port Secure Digital Computer hardware Electronic engineering Electronics
296	Debugging the OpenRISC 1000 with gdb Target Processor Manual Second Edition, for gdb version 6.8 Jeremy Bennett, Embecosm Limited Add to Reading List Source URL: www.embecosm.com Language: English - Date: 2013-01-16 23:54:46 Debuggers GNU Debugger IEEE standards Embedded microprocessors Joint Test Action Group OpenRISC OpenCores Gdbserver Electronics Electronic engineering Computing
297	Barric Sarah Green, test manager at Barric Simon Bayley (Barric) with Simon Payne (XJTAG) Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-02-03 05:36:00 Electronic engineering Joint Test Action Group Boundary scan Printed circuit board Field-programmable gate array Ball grid array Test engineer Digital electronics Flying probe Electronics manufacturing Manufacturing Electronics
298	Century www.xjtag.com O Brasil se liga aqui. Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-06-23 11:50:12 Electromagnetism Joint Test Action Group In-circuit test Boundary scan Information and communication technologies in education Electronics manufacturing Technology Electronics
299	www.xjtag.com Cathexis Digital surveillance leader maximises productivity with XJTAG Boundary Scan Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2014-11-07 09:56:20 Technology Boundary scan Joint Test Action Group Cathexis Flash memory Electronics manufacturing Manufacturing Electronics
300	Novatel www.xjtag.com XJTAG Technology Partner Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2012-05-04 08:21:07 Electromagnetism Joint Test Action Group Boundary scan In-circuit test Printed circuit board Flying probe Ball grid array Field-programmable gate array Electronics manufacturing Manufacturing Electronics

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